Focused ion beam (FIB) in situ lift-out (INLO) technique showing

A cryogenic, coincident fluorescence, electron and ion beam

Kleindiek Nanotechnik: In-situ lift-out

Kleindiek Nanotechnik: TEM sample preparation

Emmanuel PEREZ, Senior Engineer, Materials Science and Engineering, PhD, Savannah River National Laboratory, South Carolina, SRNL

76043-01

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

Focused Ion Beam Technology - an overview

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

A lamella (also known as a foil or membrane) prepared for Lift-Out

Electronics] Automated in-situ TEM sample preparation on a FIB-SEM

Ex situ lift-out With a Benchtop Micromanipulator - Barnett

Focused Ion Beam - an overview

An INLO sample mounted on a TEM grid.

Dual Beam - Focused Ion Beam (Dual Beam - FIB)

An improved FIB sample preparation technique for site-specific